Reliability testing project
Test ltems | Test Standards |
1. High Temperature Reverse Bias Test | JESD22-A108 |
2. Intermittent Operational Life Test | MIL-STD-75 Method 1037; AEC-Q101-Rev-D1 |
3. Continuous Operation Life Test | JESD22-A108(Optional) |
4. ESD Test | JESD22-A114-A (HBM)；IEC-60001-4-2 |
5. Peak Forward Surge Current Test | Destructive test according the part spec. |
6. High Temperature Storage Test | JESD22-A103 |
7. Low Temperature Storage Test | JESD22-A119 |
8. Constant Temperature/Humidity Storage Test | JESD22-A101 |
9. Temperature Cycling Test | JESD22-A104 |
10. Pressure Cooker Test | JESD22-A102 |
11. Solder Heat Resistance Test | JESD22-B106 |
12. Solderability Test | JESD22-B102D |
Guangdong Youfeng Microelectronics Co., Ltd. actively participates in improving the industry standards for semiconductor quality. We collaborate on various regulatory standards by continuously joining and participating in various standard development committees and industry associations, including:
| Standard Name | Standard Type | Standard Label | Establish an organization |
| Ordinary thyristors - Part 1: Bolt shaped devices | Industry standards | JB/T 8950.1-2013 | Ministry of Industry and Information Technology of the People's Republic of China |
| Ordinary Thyristors Part 2: Flat Plate Devices | Lightning surge voltage generator | JB/T 8950.2-2013 | Ministry of Industry and Information Technology of the People's Republic of China |
| Electronic components - Long term storage of semiconductor devices - Part 1: General principles | country | 20182268-T-339 | National Semiconductor Device Standardization Technical Committee (SAC/TC78) |
